Researchers from the Changchun Institute of Optics, Fine Mechanics and Physics of the Chinese Academy of Sciences recently developed a novel method to create precisely patterned single defects in molybdenum disulfide (MoS2) using the MoS2/Au moiré interface. The study was published in ACS Nano.
Controlling defects in semiconductors, particularly in two-dimensional (2D) materials such as MoS2, faces challenges. Defects, which can be intentionally introduced or naturally occur, play a crucial role in determining the properties of these materials. Recently, single defects in 2D semiconductors have garnered interest. Precisely patterning these defects has remained a challenge.
In this study, researchers utilized the MoS2/Au moiré interface, and moiré patterns as a template for the creation of single defects. By thermally annealing MoS2 samples on an Au(111) substrate, they observed the formation of triangular-shaped defects at the interface. These defects were identified as sulfur vacancies (V_S) within the interface layer of MoS2 (V_S-int).
Furthermore, researchers employed computational techniques to simulate the charge density distributions and understand the energy landscapes associated with these defects.
The study demonstrates the feasibility of creating precisely positioned single defect arrays in 2D crystals using the MoS2/Au moiré interface, which offers insights into the manipulation of defects in 2D materials for potential applications such as in quantum technology